LF, Passive, 100 kHz – 50 MHz

The Langer EMV-Technik GmbH LF passive near-field probe series (100 kHz to 50 MHz) is a range of high-precision electromagnetic compatibility (EMC) measurement tools designed for development and debugging of electronic assemblies. These passive magnetic-field probes are used for near-field emission analysis and allow engineers to localize interference sources on PCBs, cables, and components. The probes are typically connected to a spectrum analyzer or oscilloscope and are optimized for high spatial resolution, shielding, and flexible measurement distances.

  • LF1 Set Near-Field Probes (probe kit with multiple probes for general EMC scanning)
  • LF-R 400 H-Field Probe (high-sensitivity, long-distance detection)
  • LF-R 50 H-Field Probe (medium-range general-purpose probe)
  • LF-R 3 H-Field Probe (high-resolution probe for ICs and fine PCB structures)
  • LF-B 3 H-Field Probe (orthogonal coil design for hard-to-reach PCB areas)
  • LF-U 5 H-Field Probe (for cables, connectors, and wide conductors; current-coupling style)
  • LF-U 2.5 H-Field Probe (high-selectivity probe for IC pins and SMD components)
  • LF-K 7 H-Field Probe (for detecting circular/edge magnetic field structures)

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