- SX1 Set Near-Field Probes (1 GHz to 10 GHz) – Complete probe kit containing E-field and H-field probes for high-resolution EMC measurements and interference source localization on electronic assemblies and ICs.
- SX-R 20-1 Set Near-Field Probe (1 GHz to 20 GHz) – Complete H-field probe set designed for detecting and analyzing high-frequency magnetic fields up to 20 GHz with close-range measurements on PCB traces, components, and IC pins.
- SX-R 3-1 H-Field Probe (1 GHz to 10 GHz) – High-resolution magnetic-field probe with a compact probe head for identifying very small RF emission sources and measuring in hard-to-reach areas around IC pins and dense PCB layouts.
- SX-R 20-1 H-Field Probe (1 GHz to 20 GHz) – Ultra-wideband magnetic-field probe featuring a compact shielded design for locating high-frequency emissions from traces, individual components, and integrated circuits.
- SX-B 3-1 H-Field Probe (1 GHz to 10 GHz) – Orthogonal magnetic-field probe with a 90° coil orientation, allowing measurements in confined spaces and direct access to difficult PCB locations.
- SX-E 03 E-Field Probe (1 GHz to 10 GHz) – Compact electric-field probe with a 4 × 4 mm sensing area, designed for locating very small E-field sources on conductors, components, and printed circuit boards.
