Langer EMV-Technik

Advanced EMC measurement, diagnostic, and immunity testing solutions for PCB and IC development.

Products

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Langer EMV-Technik is a leading provider of EMC measurement and diagnostic solutions, specializing in tools for emissions analysis, immunity testing, and EMC troubleshooting. With expertise in research, development, consulting, and training, the company helps engineers identify and resolve EMC issues during PCB, device, and integrated circuit development.

Products & Services

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Langer EMV-Technik develops advanced EMC measurement and test solutions that support the design, analysis, and optimization of electronic assemblies, devices, and integrated circuits. Its technologies enable engineers to identify EMC weaknesses early in the development process, helping improve product reliability, performance, and compliance with international standards.

In addition to its measurement equipment, the company provides EMC consulting, analysis services, workshops, and technical training programs. Combining practical EMC expertise with innovative diagnostic tools, Langer EMV-Technik supports customers in accelerating product development and resolving complex electromagnetic compatibility challenges.

Key Products

Products

Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
LF-cover
The Langer EMV-Technik GmbH LF passive near-field probe series (100 kHz to 50 MHz) is a range of high-precision...
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RF-cover
The Langer EMV-Technik GmbH RF Passive Near-Field Probe Series (30 MHz to 3 GHz) is designed for high-frequency...
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XF-cover
The Langer EMV XF Passive Near-Field Probe Series (30 MHz to 6 GHz) is a high-frequency EMC measurement...
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SX-cover
The Langer EMV SX Passive Near-Field Probe Series (1 GHz to 20 GHz) is designed for ultra-high-frequency...
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MFA-cover
The Langer EMV MFA Active Near-Field Probe Series (1 MHz to 6 GHz) consists of active magnetic-field...
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CM-SHP-cover
The CM-SHP Customized Shapes series consists of custom-designed near-field probes developed to meet specific...
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P1-Set-cover
The mini burst field generators are particularly small. They are used to identify and eliminate weak...
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P23-Set-cover
The P23`s interference pulse runs through and couples to the digital IC inputs under test, like Reset,...
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P11t-Set-cover
The P11t mini burst field generator is a development accompanying tool for interference immunity analysis....
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P12t-Set-cover
During the development phase the P12t mini burst field generator can be used to detect weak spots on...
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