Langer EMV-Technik

Langer EMV-Technik is in the forefront of research, development, and production in the field of EMC. Through EMC experimental seminars and EMC workshops they offer their comprehensive knowledge to our customers.

Products and Services

Mini Burst Field Generators Set
Near-Field Probes
Preamplifier
Optical Signal Transmission
MP ESD Field set
Measuring and Calibration Stations
EMC Workshop

Products

Near-Field Probes

Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.

LF, Passive, 100 kHz – 50 MHz
The LF family consists of seven magnetic-field probes, four of which are included in our LF1 probe set. We are happy to create customized sets upon request.

RF, Passive, 30 MHz – 3 GHz
The RF family consists of nine magnetic field probes and six E-field probes, which are available in sets. These sets are optimized for different measurement tasks. We are happy to create customized sets upon request.

XF, Passive, 30 MHz – 6 GHz
The XF family consists of four magnetic-field probes and three E-field probes. The XF1 set (four magnetic-field probes and one E-field probe) as well as customized sets are available.

SX, Passive, 1GHz – 10 GHz
The SX family consists of two magnetic-field probes and one E-field probe. These probes are available in the SX1 set.

MFA, Active, 1MHz – 6 GHz
The MFA family consists of four active magnetic field probes. The MFA 01 includes three magnetic field probes. The MFA 02 set consists of two magnetic field probes for low frequency measurements.

CM-SHP (Customized Shapes)
Langer EMV-Technik GmbH also manufactures special shapes of near-field probes according to customer requirements. Here are some examples.

Mini Burst Field Generators

Mini burst field generators are small and handy burst generators used to detect weak spots in the device under test.

P1 Set (Mini Burst Field Generators)
The mini burst field generators are particularly small. They are used to identify and eliminate weak points in electronic assemblies in the development phase. They generate a burst or an ESD field at their tip. The mini burst generators are guided by hand across the equipment under test (e.g. printed circuit board) with their field-emitting tips close to its surface.

P23 Set (Mini Burst Field Generator (E))
The P23`s interference pulse runs through and couples to the digital IC inputs under test, like Reset, Clock, Quartz or the respective signal lines. The extremly thin tip of P23 is suitable for testing finest structures.

P11t Set (Mini Burst Field Generator (B, Trigger))
The P11t mini burst field generator is a development accompanying tool for interference immunity analysis. The fast transient magnetic fields, which emerge out of its tip, are used for detecting weak spots on the assemblies. The mini burst field generator has a TTL trigger input. Signals from the device under test or an external control logic can be used for synchronizing magnetic field interferences.

P12t Set (Mini Burst Field Generator (B, Trigger))
During the development phase the P12t mini burst field generator can be used to detect weak spots on assemblies. Fast transient magnetic field flows from the tip that follows the principle of a coupling clamp. The mini burst field generator has a TLL trigger input. Signals from out of the device under test or an external control logic can be used to synchronize the magnetic disturbance field. This allows for a precise noise immunity analysis of complex circuits during certain operating conditions.