The CM-SHP Customized Shapes series consists of custom-designed near-field probes developed to meet specific EMC measurement requirements that cannot be addressed by standard probe geometries. Manufactured according to customer specifications, these specialized probes enable optimized magnetic-field and electric-field measurements for unique PCB layouts, components, assemblies, and test environments. The series provides tailored solutions for advanced EMC diagnostics, interference localization, and RF field analysis.
