XF, Passive, 30 MHz – 6 GHz

The Langer EMV XF Passive Near-Field Probe Series (30 MHz to 6 GHz) is a high-frequency EMC measurement system designed for precise detection and localization of electromagnetic emissions on electronic assemblies. The probes support both electric-field and magnetic-field analysis and are optimized for step-by-step debugging of RF interference sources on PCBs, cables, and components. With a wide frequency range up to 6 GHz and interchangeable probe geometries, the system enables both broad-area scanning and high-resolution pinpointing of emissions during product development and validation.

  • XF1 Set Near-Field Probes (complete probe kit with multiple H-field and E-field probes for general EMC scanning)
  • XF-R 400-1 H-Field Probe (high-sensitivity probe for long-distance or broad-area emission detection)
  • XF-R 100-1 H-Field Probe (medium-range probe for identifying larger interference sources)
  • XF-R 3-1 H-Field Probe (high-resolution probe for detailed PCB-level RF emission tracing)
  • XF-B 3-1 H-Field Probe (orthogonal coil probe for surface-level PCB measurements and tight spaces)
  • XF-U 2.5-1 H-Field Probe (selective probe for currents in traces, IC pins, and connectors)
  • XF-E 04s E-Field Probe (high-resolution electric-field probe for near-surface IC and PCB measurements)
  • XF-E 09s E-Field Probe (medium-resolution E-field probe for decoupled emissions above components)
  • XF-E 10 E-Field Probe (ultra-fine E-field probe for detecting very small emission sources such as IC pins and micro traces)
https://www.langer-emv.de/en/category/xf-passive-30-mhz-up-to-6-ghz/34
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