RF, Passive, 30 MHz – 3 GHz

The Langer EMV-Technik GmbH RF Passive Near-Field Probe Series (30 MHz to 3 GHz) is designed for high-frequency EMC diagnostics and troubleshooting of electronic circuits. These passive probes enable precise detection and localization of RF interference sources on PCBs, cables, and components. Optimized for use with spectrum analyzers and oscilloscopes, the series supports both electric-field and magnetic-field measurements, offering high spatial resolution for detailed emission analysis from broad-area scanning to fine fault isolation.

  • RF Basic Set Near-Field Probes (entry-level set for general RF emission scanning)
  • RF1 Set Near-Field Probes (comprehensive probe kit for standard RF troubleshooting)
  • RF2 Set Near-Field Probes (advanced set with improved resolution and sensitivity)
  • RFS Set (RF Scanner System) (integrated scanning solution for systematic EMC analysis)
  • RF-R 50 Ohm H-Field Probe (high-resolution magnetic-field probe for localized emissions)
  • RF-R 400 H-Field Probe (sensitive probe for broader RF field detection)
  • RF-B 3 H-Field Probe (orthogonal coil design for complex PCB geometries)
  • RF-U Series H-Field Probes (for current flow and cable-related emissions)
  • RF-K Series H-Field Probes (optimized for edge, loop, and localized magnetic field detection)
  • RF-E Series E-Field Probes (electric-field probes for surface and radiated emission analysis)

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